Advanced Mathematical And Computational Tools In Metrology And Testing Ix Hardback
Edited by Franco (Imeko Tc21, Italy) Pavese, Markus (Physikalisch-technische Bundesanstalt, Germany) Baer, Jean-remy (Lab National De Metrologie Et D'essais, France) Filtz, Alistair B (Nat'l Physical Lab, Uk) Forbes, Leslie (Sp Technical Research Inst Of Sweden, Sweden) Pendrill, Kastsuhiro (National Metrology Inst Of Japan, Aist, Japan) Shirono
Part of the Series on Advances in Mathematics for Applied Sciences series
Hardback
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Description
This volume contains original, refereed worldwide contributions.
They were prompted by presentations made at the ninth AMCTM Conference held in Goeteborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing.The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.
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Available to Order - This title is available to order, with delivery expected within 2 weeks
- Format:Hardback
- Pages:468 pages
- Publisher:World Scientific Publishing Co Pte Ltd
- Publication Date:27/03/2012
- Category:
- ISBN:9789814397940
Information
-
Available to Order - This title is available to order, with delivery expected within 2 weeks
- Format:Hardback
- Pages:468 pages
- Publisher:World Scientific Publishing Co Pte Ltd
- Publication Date:27/03/2012
- Category:
- ISBN:9789814397940
