Scanning Electron Microscopy and X-Ray Microanalysis : Third Edition Hardback
by Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
Hardback
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Description
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis.
The authors emphasize the practical aspects of the techniques described.
Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.
Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens.
In addition techniques for the elimination of charging in non-conducting specimens are detailed.
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Out of StockMore expected soonContact us for further information
- Format:Hardback
- Pages:689 pages, XIX, 689 p. With online files/update.
- Publisher:Springer Science+Business Media
- Publication Date:30/04/2007
- Category:
- ISBN:9780306472923
Other Formats
- PDF from £84.58
Information
-
Out of StockMore expected soonContact us for further information
- Format:Hardback
- Pages:689 pages, XIX, 689 p. With online files/update.
- Publisher:Springer Science+Business Media
- Publication Date:30/04/2007
- Category:
- ISBN:9780306472923