Electron Microprobe Analysis and Scanning Electron Microscopy in Geology Paperback / softback
by S. J. B. (University of Cambridge) Reed
Paperback / softback
- Information
Description
Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint.
Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results.
Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership.
The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
Information
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Out of StockMore expected soonContact us for further information
- Format:Paperback / softback
- Pages:212 pages, Worked examples or Exercises
- Publisher:Cambridge University Press
- Publication Date:10/06/2010
- Category:
- ISBN:9780521142304
Information
-
Out of StockMore expected soonContact us for further information
- Format:Paperback / softback
- Pages:212 pages, Worked examples or Exercises
- Publisher:Cambridge University Press
- Publication Date:10/06/2010
- Category:
- ISBN:9780521142304