Nanometer-scale Defect Detection Using Polarized Light
Pierre-Richard Dahoo
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Nanometer-scale Defect Detection Using Polarized Light
Pierre-Richard Dahoo
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Format: eBook (EPUB)
Applications and Metrology at Nanometer Scale 1 : Smart Materials, Electromagnetic Waves and Uncertainties
Pierre-Richard Dahoo
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Format: eBook (EPUB)
Applications and Metrology at Nanometer Scale 1 : Smart Materials, Electromagnetic Waves and Uncertainties
Pierre-Richard Dahoo
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Format: eBook (PDF)
Applications and Metrology at Nanometer-Scale 2 : Measurement Systems, Quantum Engineering and RBDO Method
Pierre-Richard Dahoo
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Format: eBook (PDF)
Applications and Metrology at Nanometer-Scale 2 : Measurement Systems, Quantum Engineering and RBDO Method
Pierre-Richard Dahoo
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Format: eBook (EPUB)
Defauts a l'echelle nanometrique en lumiere polarisee
Pierre Richard Dahoo
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Applications et metrologie a l'echelle nanometrique 1
Pierre Richard Dahoo
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Format: eBook (PDF)
Applications et metrologie a l'echelle nanometrique 2
Pierre Richard Dahoo
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Applications and Metrology at Nanometer Scale 1 : Smart Materials, Electromagnetic Waves and Uncertainties
Pierre-Richard Dahoo
Available to Order - This title is available to order, with delivery expected within 2 weeks
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Available to Order - This title is available to order, with delivery expected within 2 weeks
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Add to BasketApplications and Metrology at Nanometer-Scale 2 : Measurement Systems, Quantum Engineering and RBDO Method
Pierre-Richard Dahoo
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£107.22
Available to Order - This title is available to order, with delivery expected within 2 weeks
Book (Hardback)
Add to BasketNanometer-scale Defect Detection Using Polarized Light
Pierre-Richard Dahoo
Available to Order - This title is available to order, with delivery expected within 2 weeks
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£138.95
£107.96
Available to Order - This title is available to order, with delivery expected within 2 weeks
Book (Hardback)
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