Thin Films:: Volume 130 : Stresses and Mechanical Properties I
John C. (Stanford University, California) Bravman
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Laser Ablation for Materials Synthesis: Volume 191
David C. (Brown University, Rhode Island) Paine
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Materials Reliability in Microelectronics VIII: Volume 516
John C. (Stanford University, California) Bravman
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Specimen Preparation for Transmission Electron Microscopy of Materials III: Volume 254
Ron Anderson
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