Reliability Wearout Mechanisms in Advanced CMOS Technologies Hardback
by Alvin W. (IBM) Strong, Ernest Y. (IBM) Wu, Rolf-Peter (Infineon) Vollertsen, Jordi (Universitat Autonoma de Barcelona, Spain) Sune, Giuseppe (IBM) La Rosa, Timothy D. (IBM) Sullivan, Stewart E. Rauch
Part of the IEEE Press Series on Microelectronic Systems series
Hardback
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Description
This invaluable resource tells the complete story of failure mechanisms-from basic concepts to the tools necessary to conduct reliability tests and analyze the results.
Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.
It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place.
Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.
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Available to Order - This title is available to order, with delivery expected within 2 weeks
- Format:Hardback
- Pages:640 pages, Photos: 25 B&W, 0 Color; Drawings: 475 B&W, 0 Color; Tables: 70 B&W, 0 Color
- Publisher:John Wiley & Sons Inc
- Publication Date:04/09/2009
- Category:
- ISBN:9780471731726
Information
-
Available to Order - This title is available to order, with delivery expected within 2 weeks
- Format:Hardback
- Pages:640 pages, Photos: 25 B&W, 0 Color; Drawings: 475 B&W, 0 Color; Tables: 70 B&W, 0 Color
- Publisher:John Wiley & Sons Inc
- Publication Date:04/09/2009
- Category:
- ISBN:9780471731726