VLSI Test Principles and Architectures : Design for Testability PDF
by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
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Description
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
- Most up-to-date coverage of design for testability.
- Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
- Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Information
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- Format:PDF
- Pages:808 pages
- Publisher:Elsevier Science
- Publication Date:14/08/2006
- Category:
- ISBN:9780080474793
Information
-
Download Now
- Format:PDF
- Pages:808 pages
- Publisher:Elsevier Science
- Publication Date:14/08/2006
- Category:
- ISBN:9780080474793