Cross-Talk Noise Immune VLSI Design Using Regular Layout Fabrics, PDF eBook

Cross-Talk Noise Immune VLSI Design Using Regular Layout Fabrics PDF

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This book was motivated by the problems being faced with shrinking IC process feature sizes.

It is well known that as process feature sizes shrink, a host of electrical problems like cross-talk, electromigration, self-heat, etc. are becoming important. Cross-talk is one of the major problems since it results in unpredictable design behavior.

In particular, it can result in significant delay variation or signal integrity problems in a wire, depending on the state of its neighboring wires.

Typical approaches to tackle the cross-talk problem attempt to fix the problem once it is created.

In our approach, we ensure that cross-talk is eliminated by design.

The work described in this book attempts to take an "outside-the-box" view and propose a radically different design style.

This design style first imposes a fixed layout pattern (or fabric) on the integrated circuit, and then embeds the circuit being implemented into this fabric.

The fabric is chosen carefully in order to eliminate the cross-talk problem being faced in modem IC processes.

With our choice of fabric, cross-talk between adjacent wires on an IC is reduced by between one and two orders of magnitude.

In this way, the fabric concept eliminates cross-talk up-front, and by design.

We propose two separate design flows, each of which uses the fabric concept to implement logic.

The first flow uses fabric-compliant standard cells as an im- plementation vehicle.

We call these cells fabric cells, and they have the same logic functionality as existing standard cells with which they are compared.

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