Thermal-Aware Testing of Digital VLSI Circuits and Systems, Hardback Book



This book aims to highlight the research activities in the domain of thermal-aware testing.

Thermal-aware testing can be employed both at circuit level and at system levelDescribes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniquesThis book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips


  • Format: Hardback
  • Pages: 118 pages, 10 Illustrations, black and white
  • Publisher: Taylor & Francis Inc
  • Publication Date:
  • Category: Electrical engineering
  • ISBN: 9780815378822



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