Thermal-Aware Testing of Digital VLSI Circuits and Systems Hardback
by Santanu Chattopadhyay
Hardback
- Information
Description
This book aims to highlight the research activities in the domain of thermal-aware testing.
Thermal-aware testing can be employed both at circuit level and at system levelDescribes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniquesThis book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
Information
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Out of StockMore expected soonContact us for further information
- Format:Hardback
- Pages:118 pages, 10 Illustrations, black and white
- Publisher:Taylor & Francis Inc
- Publication Date:25/04/2018
- Category:
- ISBN:9780815378822
Other Formats
- Paperback / softback from £18.42
- EPUB from £15.38
- PDF from £15.38
Information
-
Out of StockMore expected soonContact us for further information
- Format:Hardback
- Pages:118 pages, 10 Illustrations, black and white
- Publisher:Taylor & Francis Inc
- Publication Date:25/04/2018
- Category:
- ISBN:9780815378822