Hardback
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Description
This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation.
This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.
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Out of StockMore expected soonContact us for further information
- Format:Hardback
- Pages:504 pages
- Publisher:Taylor & Francis Inc
- Publication Date:26/04/1995
- Category:
- ISBN:9780824795542
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Information
-
Out of StockMore expected soonContact us for further information
- Format:Hardback
- Pages:504 pages
- Publisher:Taylor & Francis Inc
- Publication Date:26/04/1995
- Category:
- ISBN:9780824795542
