Introduction to Analytical Electron Microscopy
John Hren
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ISTFA 2021 : Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis
ASM International
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X-Ray Diffraction for Materials Research : From Fundamentals to Applications
Myeongkyu (Point Pleasant, New Jersey, USA) Lee
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Micelles : Theoretical and Applied Aspects
Y. Moroi
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Positron Annihilation in Semiconductors : Defect Studies
Reinhard Krause-Rehberg
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Emerging Challenges for Experimental Mechanics in Energy and Environmental Applications, Proceedings of the 5th International Symposium on Experimental Mechanics and 9th Symposium on Optics in Industr
Amalia Martinez-Garcia
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