Quantum Metrology with Photoelectrons, Volume 3 : Analysis methodologies
Paul (National Research Council of Canada, Canada) Hockett
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Quality Assurance for Scientists and Engineers : A practical guide
Steven Michael Judge
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Proceedings of the 30th International Laser Radar Conference
John T. Sullivan
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Inspection of Medical Devices : For Regulatory Purposes
Almir Badnjevic
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Optically Trapped Microspheres as Sensors of Mass and Sound : Brownian Motion as Both Signal and Noise
Logan Edward Hillberry
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The Strontium Molecular Lattice Clock : Vibrational Spectroscopy with Hertz-Level Accuracy
Kon H. Leung
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Analytical Evaluation of Uncertainty Propagation for Probabilistic Design Optimisation
Melanie Po-Leen (University of Waikato (New Zealand)) Ooi
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Scanning Electron Microscopy and X-Ray Microanalysis
Joseph I. Goldstein
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Multiscale Methods : Bridging the Scales in Science and Engineering
Jacob (Rosalind and John J Redfern Chaired Professor of Engineer Fish
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Gravity, Magnetic and Electromagnetic Gradiometry (Second Edition) : Strategic technologies in the 21st century
Alexey V (Trinity Research Labs and University of Western A Veryaskin
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Optical Measurements for Scientists and Engineers : A Practical Guide
Arthur (Harvard University, Massachusetts) McClelland
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Counterexamples in Measure and Integration
Rene L. (Technische Universitat, Dresden) Schilling
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From Artefacts to Atoms : The BIPM and the Search for Ultimate Measurement Standards
Terry (Retired Emeritus Director, Retired Emeritus Director, BI Quinn
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Handbook of Neural Activity Measurement
Romain (Ecole Normale Superieure, Paris) Brette
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Principles of Materials Characterization and Metrology
Kannan M. (Professor, Dept of Materials Science & Engineerin Krishnan
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Measurements and their Uncertainties : A practical guide to modern error analysis
Ifan (Department of Physics, University of Durham) Hughes
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The Border Effect in High-Precision Measurement
Wei Zhou
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The Essentials of Power System Dynamics and Control
Hemanshu Roy Pota
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Precision Machines
Zhuangde Jiang
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High Definition Metrology Based Surface Quality Control and Applications
Shichang Du
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Metrology for Inclusive Growth of India
Dinesh K. Aswal
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Modern Mossbauer Spectroscopy : New Challenges Based on Cutting-Edge Techniques
Yutaka Yoshida
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ISUW 2019 : Proceedings of the 5th International Conference and Exhibition on Smart Grids and Smart Cities
Reji Kumar Pillai
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