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Polycrystalline Thin Films - Structure, Texture, Properties III: Volume 472 - Book

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Materials Reliability in Microelectronics VII: Volume 473 - Book

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Epitaxial Oxide Thin Films III: Volume 474 - Book

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Science and Technology of Semiconductor Surface Preparation: Volume 477 - Book

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Materials for Optical Limiting II: Volume 479 - Book

Materials for Optical Limiting II: Volume 479

Ruth Pachter

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Advanced Metallization and Interconnect Systems for ULSI Applications in 1996: Volume 12 - Book

Advanced Metallization and Interconnect Systems for ULSI Applications in 1996: Volume 12

Robert Havemann

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Nitride Semiconductors: Volume 482 - Book

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Semiconductors for Room-Temperature Radiation Detector Applications II: Volume 487 - Book

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Electrical, Optical and Magnetic Properties of Organic Solid-State Materials IV: Volume 488 - Book

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Semiconductor Process and Device Performance Modelling: Volume 490 - Book

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Science and Technology of Magnetic Oxides: Volume 494 - Book

Science and Technology of Magnetic Oxides: Volume 494

Michael F. (Los Alamos National Laboratory) Hundley

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Electrically Based Microstructural Characterization II: Volume 500 - Book

Electrically Based Microstructural Characterization II: Volume 500

Rosario A. (Georgia Institute of Technology) Gerhardt

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Thin-Films-Stresses and Mechanical Properties VII: Volume 505 - Book

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Advanced Metallization and Interconnect Systems for ULSI Applications in 1997: Volume 13 - Book

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Amorphous and Microcrystalline Silicon Technology - 1998: Volume 507 - Book

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Flat-Panel Display Materials - 1998: Volume 508 - Book

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Defect and Impurity Engineered Semiconductors II: Volume 510 - Book

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Hydrogen in Semiconductors and Metals: Volume 513 - Book

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Electronic Packaging Materials Science X: Volume 515 - Book

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Materials Reliability in Microelectronics VIII: Volume 516 - Book

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Epitaxy and Applications of Si-Based Heterostructures: Volume 533 - Book

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