Radiation Detection Systems : Sensor Materials, Systems, Technology, and Characterization Measurements
Krzysztof (Redlen Technologies Inc., Canada.) Iniewski
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Jan (DxRay Inc., USA.) Iwanczyk
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Jan (DxRay Inc., USA.) Iwanczyk
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Ioanis (University of Alberta, Edmonton, Canada) Nikolaidis
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Gul N. (Ryerson University, Toronto, Ontario, Canada) Khan
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Gul N. (Ryerson University, Toronto, Ontario, Canada) Khan
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Building Sensor Networks : From Design to Applications
Ioanis (University of Alberta, Edmonton, Canada) Nikolaidis
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Circuits at the Nanoscale : Communications, Imaging, and Sensing
Krzysztof (Redlen Technologies Inc., Canada.) Iniewski
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Building Sensor Networks : From Design to Applications
Ioanis (University of Alberta, Edmonton, Canada) Nikolaidis
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Embedded and Networking Systems : Design, Software, and Implementation
Gul N. (Ryerson University, Toronto, Ontario, Canada) Khan
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Spectral, Photon Counting Computed Tomography : Technology and Applications
Katsuyuki Taguchi
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James W. M. (Swinburne University of Technology, Melbourne, Aust Chon
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Santosh K. (Rochester Institute of Technology, New York, USA) Kurinec
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Krzysztof (Redlen Technologies Inc., Canada.) Iniewski
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Krzysztof (Redlen Technologies Inc., Canada.) Iniewski
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Krzysztof (Redlen Technologies Inc., Canada.) Iniewski
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Reza (Technical University of Eindhoven, Netherlands) Mahmoudi
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James E. (Portland State University, Oregon, USA) Morris
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James E. (Portland State University, Oregon, USA) Morris
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Novel Advances in Microsystems Technologies and Their Applications
Laurent A. Francis
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Nanoscale Semiconductor Memories : Technology and Applications
Santosh K. (Rochester Institute of Technology, New York, USA) Kurinec
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